Scanning probe microscopy enables three-dimensional imaging at the nanometer scale by scanning a very sharp probe across a surface.

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Measurements can be carried out in air and in situ. The probe can also be used to manipulate the sample surface at the nanometer scale.

    Atomic force microscopy (AFM)

    Three-dimensional imaging in air and in solution down to the nanometer range.

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    Nanomechanical testing

    Measurement of hardness, elastic modulus and wear resistance at the nanoscale.

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    Confocal raman imaging and AFM

    Co-localised confocal Raman microscope and AFM to perform both chemical mapping and three-dimensional AFM imaging of a sample. The system can be used for confocal Raman microscopy, confocal optical microscopy and AFM individually or for combined confocal Raman microscopy and AFM (such as Tip-enhanced Raman Spectroscopy (TERS).

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