X-ray studies in the fields of materials science and engineering are provided for by a specialised, highly accurate and adaptable diffractometer.

Characterisation of all aspects of thin films, the perfection of single crystals (rocking curves), their orientation and the rapid phase identification of powdered samples are possible.

tech-XRD

    Single crystal structure determination

    X-ray crystallography is a method of determining the arrangement of atoms within a crystal. A beam of X-rays strikes a crystal and diffracts into many beams in specific directions. The angles and intensities of these diffracted beams, make it possible to produce a three-dimensional picture of the electron density within the crystal. From this, it is possible to locate the positions of the atoms and determine the structure of the molecule or molecules within the crystal.

    Single crystal structure determination for small molecules in the temperature range 10-300K.

    X-Ray Diffraction

    In this technique, a sample is irradiated with x-rays and the intensity of the diffracted beams is measured as a function of scattering angle. X-ray diffraction techniques can be used for analysing powder and thin film specimens. Information that can be obtained includes phase content, crystallite size and strain, film thickness, crystal orientation, and crystal perfection.

    Absolute configuration determination

    Absolute configuration determination for a molecule where the heaviest atom is as light as oxygen or fluorine.

    Electron density studies

    High-resolution electron density studies at temperatures with the range 90-300K using the cryojet or in the range 10-90K with the helojet.

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