Scanning Probe Microscope

Versatile Scanning Probe Microscope capable of a variety of imaging modes including Contact and Non-Contact Atomic Force Microscopy, Scanning Tunneling Microscopy, Magnetic and Electric Force Microscopy, Imaging in fluids, and nano-tribological studies.  The microscope has Nanoscope III controller with signal breakout box and a vibration isolation table and hood.  Scan size 60 x 60 µm with 6 µm z range.