The system at the CMCA is an Empyrean multi-purpose research diffractometer. It is aimed primarily at materials research but is very flexible, having options covering a large number of techniques. The radiation is Copper K alpha and the instrument is equipped with a wide range of collimators, monochrometers, detector systems and a high-precision, multi-purpose, five-axis sample stage. A computer control system operates the instrument and includes analysis software for all modes of operation.
Techniques
- Rapid powder x-ray diffraction
- Grazing incidence x-ray diffraction
- Rocking curves
- Crystallographic orientation
- Offline analysis of data
Instrument Specifications
- Grazing incidence x-ray diffraction is used to find the thickness of thin, (5-200nm depending on mean atomic number) crystalline films on polished, flat surfaces. It is possible to deal with multiple films to a limited extent. Amorphous films can be measured
- Thin film analysis. The crystallographic texture and composition can be determined using XRD Phase Analysis
- Rocking curve measurements allow the surface perfection to be determined
- Powder XRD done at standard angular resolutions is extremely rapid and easy to perform. Very high angular resolution scans are possible to help solve difficult problems
- Crystallographic orientation of samples up to 20x20 20mm can be determined
Further Information
National Facilities
Funded by the Australian National Fabrication Facility. Providing micro and nano fabrication facilities for Australia's researchers.