Further information
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The principles and applications of high-resolution transmission electron microscopy (TEM) are covered in this course.
Who can enrol
Researchers, PhD and honours students with TEM experience wishing to obtain images of crystalline materials with atomic resolution as part of their research project at the Centre or other facilities.
Course outline
The principles and applications of high-resolution TEM will be reviewed through an initial lecture.
Practical training on the microscope will introduce attendees to the alignment procedures and software (Digital Micrograph) for obtaining high-resolution TEM images with a digital camera at the centre. Basic image analysis and interpretation will be included. There will be opportunities for attendees to discuss the use of high-resolution TEM in their research project with a member of Centre staff.
Attendees will learn how to obtain and interpret high-resolution TEM data, including:
- how to set up and align the microscope for high-resolution imaging
- how to adjust the objective stigmation and image focus using Fourier Transforms of high-resolution images
- how to obtain images at atomic resolution.
- basic image interpretation (for example,is the sample crystalline or amorphous?)
- basic image analysis (measuring planar spacings and interplanar angles)
- introduction to image simulation
- sample requirements for high-resolution TEM (but not sample preparation methods).
Basic information covered in the TEM training course is not included in this workshop.
Also not included is crystallography and the understanding of crystal structures (it is assumed that you have a basic understanding of these topics) and detailed theory of high-resolution imaging and image simulation.
Course materials
Copies of lecture notes and supporting documentation will be provided in electronic form before the course.
You are expected to be familiar with the basic principles and applications of high-resolution TEM. Many TEM-related books can be found in the UWA Library including:
- D. Shindo, K. Hiraga (1998) High-resolution electron microscopy for materials science, Springer.
- J.C.H. Spence (2003) High-resolution electron microscopy, Oxford University Press.
We recommend you read the following article and references before attending the workshop:
- J. C. H. Spence, 'The future of atomic resolution electron microscopy for materials science', Materials Science and Engineering: R: Reports, V26 (Issues 1-2), 26 Oct 1999, Pages 1-49.
The Library has a set of DVD recordings of microscopy workshops run by the Microscopy Society of America.
Prerequisites
You must have completed the TEM training course.
We assume that you have a basic knowledge of crystal structures and crystallography and are familiar with the basic operation of a TEM and the TEM aspects of your research project.
We also recommend that you gain some experience operating a TEM before attending the workshop.
Registration and cost
Advanced workshops are organised on an irregular basis, when a number of users have expressed an interest in the course. Contact Martin Saunders to register your interest.
Preference is given to registered Centre users. Others will be allocated places if maximum numbers are not reached.