Scanning probe microscopy enables three-dimensional imaging at the nanometer scale by scanning a very sharp probe across a surface.
Measurements can be carried out in air and in situ. The probe can also be used to manipulate the sample surface at the nanometer scale.
Atomic force microscopy (AFM)
Three-dimensional imaging in air and in solution down to the nanometer range.
Measurement of hardness, elastic modulus and wear resistance at the nanoscale.
Confocal raman imaging and AFM
Co-localised confocal Raman microscope and AFM to perform both chemical mapping and three-dimensional AFM imaging of a sample. The system can be used for confocal Raman microscopy, confocal optical microscopy and AFM individually or for combined confocal Raman microscopy and AFM (such as Tip-enhanced Raman Spectroscopy (TERS).
Keysight 5500 SPM
The Keysight Scanning Probe Microscope (SPM) is a multi-functional research system for atomic force microscopy (AFM)and scanning tunnelling microscopy (STM), providing atomic scale resolution 3-dimentional imaging of surfaces.